Using an NI PXI-Based Solution to Develop a Pipelined Test System for Proximity Sensors

With the implementation of an NI PXI-based test system that uses an NI USB device and LabVIEW software, we developed the test system faster and more cost-effectively

The Challenge:
Developing a proximity sensor test system that achieves the fastest test time possible for test parameters including typical infrared (IR) LED parametric test, proximity sensing functionality tests, and I2C communication tests.

The Solution:
Using NI hardware and software to develop a functional test system specifically designed for proximity sensor devices.

For more information about the system, please visit this link.